单端口器件FDTD仿真中非线性x参数的提取

2021 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM) Pub Date : 2021-01-04 DOI:10.23919/USNC-URSINRSM51531.2021.9336444

J. Kast, A. Elsherbeni

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引用次数: 1

摘要

提出了时域有限差分电磁仿真中非线性器件的x参数提取公式。测试了一个包含二极管的仿真域，并应用了几种激励波形来捕捉二极管的非线性行为。仿真结果的后处理允许提取x参数值，并将开发程序的结果与商用模拟器的结果进行比较，获得了很好的一致性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Extraction of Nonlinear X-Parameters from FDTD Simulation of a One-Port Device

A formulation is developed for X-Parameters extraction of nonlinear devices when a finite-difference time-domain electromagnetic simulation is used. A simulation domain containing a diode is tested, and several excitation waveforms are applied to capture the diode's nonlinear behavior. Post-processing of simulation results allows for the extraction of X-Parameter values, and a good agreement is obtained when comparing the results from the developed procedure and a commercial simulator.

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来源期刊

2021 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM)

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