B. Corcoran, T. Vo, M. Pelusi, C. Monat, D. Xu, A. Densmore, R. Ma, S. Janz, D. Moss, B. Eggleton
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Silicon nanowire based radio-frequency spectrum analyser
We demonstrate a silicon nanowire based radio frequency spectrum analyser based on cross-phase modulation. We show that the device is accurate, with cross-chirp from photogenerated free-carriers negligible and measure RF spectra for 640Gbaud on-off-keyed data.