通用可合成测试台

Matthew Naylor, S. Moore
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引用次数: 9

摘要

编写测试台是硬件开发过程中最频繁执行的任务之一。因此,重复使用通用测试台功能的能力是提高工作效率的关键。在本文中,我们介绍了一种通用测试台,其参数由正确性规范确定,可用于测试任何设计。我们的测试台提供了几个重要功能,包括自动生成测试序列和缩小反例,并且完全可综合,允许在 FPGA 和仿真中进行严格测试。这种方法易于使用,实施成本低,并通过自动测试和简单故障案例的奖励,鼓励对硬件组件进行正式规范。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A generic synthesisable test bench
Writing test benches is one of the most frequently-performed tasks in the hardware development process. The ability to reuse common test bench features is therefore key to productivity. In this paper, we present a generic test bench, parameterised by a specification of correctness, which can be used to test any design. Our test bench provides several important features, including automatic test-sequence generation and shrinking of counter-examples, and is fully synthesisable, allowing rigorous testing on FPGA as well as in simulation. The approach is easy to use, cheap to implement, and encourages the formal specification of hardware components through the reward of automatic testing and simple failure cases.
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