新加坡同步加速器光源的高分辨率反射测量

Advances in Synchrotron Radiation Pub Date : 2008-06-01 DOI:10.1142/S1793617908000069

P. Yang, H. Moser

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引用次数: 6

摘要

综述了新加坡同步加速器光源(SSLS)的x射线反射测量(XRR)。介绍了检测仪器和方法。由聚苯乙烯-嵌段-2-乙烯基吡啶二嵌段共聚物(PS-b-P2VP)薄膜模板和氧化铟锡(ITO, In2-xSnxO3-2x)制成的两种薄膜是XRR的典型应用。本文还对自旋阀磁夹芯层进行了仿真，作为异常散射效应在XRR中的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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HIGH RESOLUTION REFLECTOMETRY AT SINGAPORE SYNCHROTRON LIGHT SOURCE

X-ray reflectometry (XRR) at Singapore Synchrotron Light Source (SSLS) is reviewed. The instrument and methods are introduced. Two films made of a poly-(styrene-block-2-vinylpyridine) diblock copolymer (PS-b-P2VP) film template and indium-tin-oxide (ITO, In2-xSnxO3-2x) are shown as typical applications of XRR. A simulation for spin valve magnetic sandwich layers is also shown as an application of anomalous scattering effect to XRR.

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Advances in Synchrotron Radiation

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