{"title":"射频能量采集器效率的温度诱导退化:实验和解释","authors":"M. Merenda, R. Carotenuto, F. D. Della Corte","doi":"10.1109/WPTC45513.2019.9055590","DOIUrl":null,"url":null,"abstract":"The conversion efficiency of an RF energy harvester is studied at 868 MHz as a function of temperature on a printed circuit board charge-pump, based on off-the-shelf diodes and capacitors. Extensive experimental measurements are presented in the temperature range from 25°C to 85°C, showing that the harvested power may significantly degrade with T, in particular at the lower incident power regimes. It is shown that the rectifiers quality, and precisely the temperature dependent rectification ratio of silicon Schottky diodes commonly used for this application, has the strongest impact of the harvester performances.","PeriodicalId":148719,"journal":{"name":"2019 IEEE Wireless Power Transfer Conference (WPTC)","volume":"33 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Temperature Induced Degradation of RF Energy Harvesters Efficiency: Experiments and Interpretation\",\"authors\":\"M. Merenda, R. Carotenuto, F. D. Della Corte\",\"doi\":\"10.1109/WPTC45513.2019.9055590\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The conversion efficiency of an RF energy harvester is studied at 868 MHz as a function of temperature on a printed circuit board charge-pump, based on off-the-shelf diodes and capacitors. Extensive experimental measurements are presented in the temperature range from 25°C to 85°C, showing that the harvested power may significantly degrade with T, in particular at the lower incident power regimes. It is shown that the rectifiers quality, and precisely the temperature dependent rectification ratio of silicon Schottky diodes commonly used for this application, has the strongest impact of the harvester performances.\",\"PeriodicalId\":148719,\"journal\":{\"name\":\"2019 IEEE Wireless Power Transfer Conference (WPTC)\",\"volume\":\"33 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 IEEE Wireless Power Transfer Conference (WPTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WPTC45513.2019.9055590\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE Wireless Power Transfer Conference (WPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WPTC45513.2019.9055590","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Temperature Induced Degradation of RF Energy Harvesters Efficiency: Experiments and Interpretation
The conversion efficiency of an RF energy harvester is studied at 868 MHz as a function of temperature on a printed circuit board charge-pump, based on off-the-shelf diodes and capacitors. Extensive experimental measurements are presented in the temperature range from 25°C to 85°C, showing that the harvested power may significantly degrade with T, in particular at the lower incident power regimes. It is shown that the rectifiers quality, and precisely the temperature dependent rectification ratio of silicon Schottky diodes commonly used for this application, has the strongest impact of the harvester performances.