{"title":"贝叶斯和非参数方法用于系统辨识和模型选择","authors":"A. Chiuso, G. Pillonetto","doi":"10.1109/ECC.2014.6862632","DOIUrl":null,"url":null,"abstract":"System Identification has been developed, by and large, following the classical parametric approach. In this tutorial we shall discuss how Bayesian statistics and regularization theory can be employed to tackle the system identification problem from a nonparametric (or semi-parametric) point of view. The present paper provides an introduction to the use of Bayesian techniques for smoothness and sparseness, which turn out to be flexible means to face the bias/variance dilemma and to perform model selection.","PeriodicalId":251538,"journal":{"name":"2014 European Control Conference (ECC)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Bayesian and nonparametric methods for system identification and model selection\",\"authors\":\"A. Chiuso, G. Pillonetto\",\"doi\":\"10.1109/ECC.2014.6862632\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"System Identification has been developed, by and large, following the classical parametric approach. In this tutorial we shall discuss how Bayesian statistics and regularization theory can be employed to tackle the system identification problem from a nonparametric (or semi-parametric) point of view. The present paper provides an introduction to the use of Bayesian techniques for smoothness and sparseness, which turn out to be flexible means to face the bias/variance dilemma and to perform model selection.\",\"PeriodicalId\":251538,\"journal\":{\"name\":\"2014 European Control Conference (ECC)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-06-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 European Control Conference (ECC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECC.2014.6862632\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 European Control Conference (ECC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECC.2014.6862632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bayesian and nonparametric methods for system identification and model selection
System Identification has been developed, by and large, following the classical parametric approach. In this tutorial we shall discuss how Bayesian statistics and regularization theory can be employed to tackle the system identification problem from a nonparametric (or semi-parametric) point of view. The present paper provides an introduction to the use of Bayesian techniques for smoothness and sparseness, which turn out to be flexible means to face the bias/variance dilemma and to perform model selection.