{"title":"基于反馈移位寄存器的密码系统安全高效的LBIST","authors":"E. Dubrova, M. Näslund, G. Selander","doi":"10.1109/ETS.2014.6847821","DOIUrl":null,"url":null,"abstract":"Cryptographic methods are used to protect confidential information against unauthorised modification or disclo-sure. Cryptographic algorithms providing high assurance exist, e.g. AES. However, many open problems related to assuring security of a hardware implementation of a cryptographic algorithm remain. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide adequate protection against malicious alterations of a circuit known as hardware Trojans. For example, a recent attack on Intel's Ivy Bridge processor demonstrated that the traditional Logic Built-In Self-Test (LBIST) may fail even the simple case of stuck-at fault type of Trojans. In this paper, we present a novel LBIST method for Feedback Shift Register (FSR)-based cryptographic systems which can detect such Trojans. The specific properties of FSR-based cryptographic systems allow us to reach 100% single stuck-at fault coverage with a small set of deterministic tests. The test execution time of the proposed method is at least two orders of magnitude shorter than the one of the pseudo-random pattern-based LBIST. Our results enable an efficient protection of FSR-based cryptographic systems from random and malicious stuck-at faults.","PeriodicalId":145416,"journal":{"name":"2014 19th IEEE European Test Symposium (ETS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Secure and efficient LBIST for feedback shift register-based cryptographic systems\",\"authors\":\"E. Dubrova, M. Näslund, G. Selander\",\"doi\":\"10.1109/ETS.2014.6847821\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cryptographic methods are used to protect confidential information against unauthorised modification or disclo-sure. Cryptographic algorithms providing high assurance exist, e.g. AES. However, many open problems related to assuring security of a hardware implementation of a cryptographic algorithm remain. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide adequate protection against malicious alterations of a circuit known as hardware Trojans. For example, a recent attack on Intel's Ivy Bridge processor demonstrated that the traditional Logic Built-In Self-Test (LBIST) may fail even the simple case of stuck-at fault type of Trojans. In this paper, we present a novel LBIST method for Feedback Shift Register (FSR)-based cryptographic systems which can detect such Trojans. The specific properties of FSR-based cryptographic systems allow us to reach 100% single stuck-at fault coverage with a small set of deterministic tests. The test execution time of the proposed method is at least two orders of magnitude shorter than the one of the pseudo-random pattern-based LBIST. Our results enable an efficient protection of FSR-based cryptographic systems from random and malicious stuck-at faults.\",\"PeriodicalId\":145416,\"journal\":{\"name\":\"2014 19th IEEE European Test Symposium (ETS)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 19th IEEE European Test Symposium (ETS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ETS.2014.6847821\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 19th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2014.6847821","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Secure and efficient LBIST for feedback shift register-based cryptographic systems
Cryptographic methods are used to protect confidential information against unauthorised modification or disclo-sure. Cryptographic algorithms providing high assurance exist, e.g. AES. However, many open problems related to assuring security of a hardware implementation of a cryptographic algorithm remain. Security of a hardware implementation can be compromised by a random fault or a deliberate attack. The traditional testing methods are good at detecting random faults, but they do not provide adequate protection against malicious alterations of a circuit known as hardware Trojans. For example, a recent attack on Intel's Ivy Bridge processor demonstrated that the traditional Logic Built-In Self-Test (LBIST) may fail even the simple case of stuck-at fault type of Trojans. In this paper, we present a novel LBIST method for Feedback Shift Register (FSR)-based cryptographic systems which can detect such Trojans. The specific properties of FSR-based cryptographic systems allow us to reach 100% single stuck-at fault coverage with a small set of deterministic tests. The test execution time of the proposed method is at least two orders of magnitude shorter than the one of the pseudo-random pattern-based LBIST. Our results enable an efficient protection of FSR-based cryptographic systems from random and malicious stuck-at faults.