{"title":"基于多分辨率分析的多层非均匀材料无损检测","authors":"Jianxin Zhu","doi":"10.1109/HKEDM.1999.836422","DOIUrl":null,"url":null,"abstract":"In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better.","PeriodicalId":342844,"journal":{"name":"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nondestructive measurement for multilayer inhomogeneous material based on multiresolution analysis\",\"authors\":\"Jianxin Zhu\",\"doi\":\"10.1109/HKEDM.1999.836422\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better.\",\"PeriodicalId\":342844,\"journal\":{\"name\":\"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HKEDM.1999.836422\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE Hong Kong Electron Devices Meeting (Cat. No.99TH8458)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HKEDM.1999.836422","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Nondestructive measurement for multilayer inhomogeneous material based on multiresolution analysis
In this paper, a new and effective method based on multiresolution analysis (wavelet analysis) is proposed. It is used to nondestructively reconstruct the depth distribution of optical-absorption coefficient in multilayer inhomogeneous material with the photothermal signals which are related to the surface temperature of a sample. Numerical simulations and experimental data show that this method is feasible and the performance of the approach is better.
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