设置:一种容错触发器,用于构建成本效益高的可靠系统

Yang Lin, Mark Zwolinski
{"title":"设置:一种容错触发器,用于构建成本效益高的可靠系统","authors":"Yang Lin, Mark Zwolinski","doi":"10.1109/IOLTS.2012.6313833","DOIUrl":null,"url":null,"abstract":"Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.","PeriodicalId":246222,"journal":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems\",\"authors\":\"Yang Lin, Mark Zwolinski\",\"doi\":\"10.1109/IOLTS.2012.6313833\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.\",\"PeriodicalId\":246222,\"journal\":{\"name\":\"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IOLTS.2012.6313833\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS.2012.6313833","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

传统的容错技术要么需要很大的开销,要么可靠性有限。我们提出了一种新的容错触发器(SETTOFF),它在一个经济高效的架构中解决了定时错误和软错误。在SETTOFF中,大多数seu是通过监视触发器输出端的非法转换来检测的,并通过反转单元状态来恢复。set、定时错误和其他seu由基于时间冗余的体系结构检测。对于10%的活动率,SETTOFF比120nm和65nm技术的库触发器分别消耗35.8%和39.7%的功率。它只比基于检测的RazorII触发器多消耗约5.7%的功率[1]。因此,SETTOFF提供了增加的容错覆盖范围,而开销仅适度增加,因此它适用于以比传统技术更低的成本构建高可靠性系统。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems
Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs are detected by monitoring the illegal transitions at the output of a flip-flop and recovered by inverting the cell state. SETs, timing errors and the other SEUs are detected by a time redundancy-based architecture. For a 10% activity rate, SETTOFF consumes 35.8% and 39.7% more power than a library flip-flop in 120nm and 65nm technologies, respectively. It only consumes about 5.7% more power than the detection based RazorII flip-flop [1]. SETTOFF therefore provides an increased coverage of fault tolerance with only moderate increase in overhead, hence it is suitable for building highly reliable systems at lower cost than the traditional techniques.
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