交流电场对GMR记录磁头产生的电荷感应

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Pub Date : 2000-09-26 DOI:10.1109/EOSESD.2000.890096

M. Honda

{"title":"交流电场对GMR记录磁头产生的电荷感应","authors":"M. Honda","doi":"10.1109/EOSESD.2000.890096","DOIUrl":null,"url":null,"abstract":"A new charge induction mechanism on a head gimbal assembly (HGA) is discussed. According to the dynamic charge induction experiments, there is 30-50 pC of charge induced on the HGA base plate by a small displacement (speed about 10 cm/s) in the 50 Hz AC power fields emanating from the AC charged plate (100 V-rms). During the manufacturing and testing processes, a chance of AC induced ESD could result due to metal-metal contacts between the base plate and the other static charge free objects under a normal ESD control environment.","PeriodicalId":332394,"journal":{"name":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2000-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Charge induction on GMR recording heads caused by AC power fields\",\"authors\":\"M. Honda\",\"doi\":\"10.1109/EOSESD.2000.890096\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new charge induction mechanism on a head gimbal assembly (HGA) is discussed. According to the dynamic charge induction experiments, there is 30-50 pC of charge induced on the HGA base plate by a small displacement (speed about 10 cm/s) in the 50 Hz AC power fields emanating from the AC charged plate (100 V-rms). During the manufacturing and testing processes, a chance of AC induced ESD could result due to metal-metal contacts between the base plate and the other static charge free objects under a normal ESD control environment.\",\"PeriodicalId\":332394,\"journal\":{\"name\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-09-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EOSESD.2000.890096\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EOSESD.2000.890096","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

讨论了一种新型的头部万向节组件电荷感应机构。根据动态电荷感应实验，在交流带电板(100 V-rms)发出的50 Hz交流电场中，小位移(速度约为10 cm/s)对HGA基板产生30-50 pC的电荷感应。在制造和测试过程中，在正常的ESD控制环境下，基板与其他无静电物体之间的金属-金属接触可能导致交流感应ESD。

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Charge induction on GMR recording heads caused by AC power fields

A new charge induction mechanism on a head gimbal assembly (HGA) is discussed. According to the dynamic charge induction experiments, there is 30-50 pC of charge induced on the HGA base plate by a small displacement (speed about 10 cm/s) in the 50 Hz AC power fields emanating from the AC charged plate (100 V-rms). During the manufacturing and testing processes, a chance of AC induced ESD could result due to metal-metal contacts between the base plate and the other static charge free objects under a normal ESD control environment.

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Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

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