{"title":"可测试性与自动测试模式生成系统的集成设计综述","authors":"E. Trischler","doi":"10.1109/DAC.1984.1585796","DOIUrl":null,"url":null,"abstract":"A general overview on an Integrated Design for Testability and Automatic Test Pattern Generation System (IDAS) is given. The major components of IDAS include: heuristic controllability/observability (C/O) analysis, prediction of testing costs, tools for evaluation, display and improvement of testability, and C/O guided automatic test pattern generator. The IDAS system includes also the logic and concurrent fault simulator CADAT. A brief description of major components with a scenario how to use IDAS is given. Future research activities are discussed.","PeriodicalId":188431,"journal":{"name":"21st Design Automation Conference Proceedings","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1984-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"An Integrated Design for Testability and Automatic Test Pattern Generation System: An Overview\",\"authors\":\"E. Trischler\",\"doi\":\"10.1109/DAC.1984.1585796\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A general overview on an Integrated Design for Testability and Automatic Test Pattern Generation System (IDAS) is given. The major components of IDAS include: heuristic controllability/observability (C/O) analysis, prediction of testing costs, tools for evaluation, display and improvement of testability, and C/O guided automatic test pattern generator. The IDAS system includes also the logic and concurrent fault simulator CADAT. A brief description of major components with a scenario how to use IDAS is given. Future research activities are discussed.\",\"PeriodicalId\":188431,\"journal\":{\"name\":\"21st Design Automation Conference Proceedings\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1984-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"21st Design Automation Conference Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1984.1585796\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"21st Design Automation Conference Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1984.1585796","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Integrated Design for Testability and Automatic Test Pattern Generation System: An Overview
A general overview on an Integrated Design for Testability and Automatic Test Pattern Generation System (IDAS) is given. The major components of IDAS include: heuristic controllability/observability (C/O) analysis, prediction of testing costs, tools for evaluation, display and improvement of testability, and C/O guided automatic test pattern generator. The IDAS system includes also the logic and concurrent fault simulator CADAT. A brief description of major components with a scenario how to use IDAS is given. Future research activities are discussed.
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