Intel 80/spl times/86处理器的伪随机与确定性测试

Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies Pub Date : 1996-09-02 DOI:10.1109/EURMIC.1996.546398

J. Sosnowski, A. Kusmierczyk

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引用次数: 2

摘要

本文研究了在系统环境下对微处理器进行测试的问题。我们讨论了两种测试微处理器的方法:确定性和伪随机。它们与英特尔80/spl倍/86处理器有关。确定性方法的许多缺点可以用伪随机测试来克服。然而，在开发伪随机测试程序时，我们还面临着其他一些问题。本文介绍了如何将这两种方法结合起来。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Pseudorandom versus deterministic testing of Intel 80/spl times/86 processors

The paper deals with the problem of testing microprocessors in the system environment. We discuss two approaches to testing microprocessors: deterministic and pseudorandom. They are related to Intel 80/spl times/86 processors. Many drawbacks of the deterministic approach can be overcome with pseudorandom tests. However developing pseudorandom test programs we face some other problems. The paper shows how to combine the two approaches.

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Proceedings of EUROMICRO 96. 22nd Euromicro Conference. Beyond 2000: Hardware and Software Design Strategies

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