Si PMOS中单轴应力与双轴应变联合作用下迁移率变化与漂移速度增强的模拟

A. Pham, C. Jungemann, B. Meinerzhagen
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引用次数: 2

摘要

本文提出了单轴应力和双轴应变共同作用下合金迁移率变化的模拟方法。本研究提供了更好的理解迁移率的变化,并预测了高应力水平下迁移率的增强。研究了非平衡态的输运。对不同单轴应力和双轴应变组合下的高场通道漂移速度特性进行了评价和比较。在不同的运输情况下,包括接近和非平衡提供了一个更好的概述由于应力/应变的运输增强。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Simulation of Mobility Variation and Drift Velocity Enhancement Due to Uniaxial Stress Combined with Biaxial Strain in Si PMOS
In this work, simulations of mobility variation due to the combination of uniaxial stress and biaxial strain are presented. This study provides a better understanding of the mobility variation and predicts the mobility enhancement for higher stress levels. Transport in the non-equilibrium regime is also investigated. High-field channel drift velocity characteristics are evaluated and compared for different combinations of uniaxial stress and biaxial strain. A better overview of the transport enhancement due to stress/strain at different transport situations including near and non-equilibrium is provided.
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