HgSiP2黄铜矿的结构和光学特性:DFT

Shikha Sharma, Hansraj Karwasara, K. Khan, A. Soni, U. Ahuja, J. Sahariya
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引用次数: 0

摘要

利用密度泛函理论(DFT)研究了HgSiP2黄铜矿化合物的光电性质。利用Wien2k代码,用TranBlaha修正的Becke Johnson势近似法确定了带隙、态密度等电子特性。计算的能带结构和带隙值1.513 eV表明HgSiP2是具有直接带隙性质的半导体。得到的介电实谱和虚谱、反射率、折射率和吸收率的数值表明了该化合物在光伏领域应用的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Structural and Optical Characteristics of HgSiP2 Chalcopyrite: DFT
The optoelectronic properties of HgSiP2 chalcopyrite compound are studied by employing density functional theory (DFT). The electronic properties such as band gap, density of states spectra are determined by TranBlaha modified Becke Johnson potential approximation using the Wien2k code. The calculated band structure and band gap value 1.513 eV reveals that HgSiP2 are semiconductor with direct band gap nature. The obtained values of real and imaginary dielectric spectra, reflectivity, refractivity and absorption reveal the feasibility of this compound in photovoltaic applications.
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