{"title":"砷化镓的可靠性研究，vol . 32 (p .37)领导的","authors":"K. Pommer","doi":"10.1109/IRPS.1975.362695","DOIUrl":null,"url":null,"abstract":"A comprehensive study of the long life and reliability characteristics of a hermetically sealed GaAsP LED has been performed using accelerated life test techniques. A degradation model was developed based on the Arrhenius equation which was found to describe a lognormal failure distribution. The Extended-Longini failure mechanism was expanded to include the effects of crystalline dislocations.","PeriodicalId":369161,"journal":{"name":"13th International Reliability Physics Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1975-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Reliability Study of GaAs, 63P.37 LED'S\",\"authors\":\"K. Pommer\",\"doi\":\"10.1109/IRPS.1975.362695\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A comprehensive study of the long life and reliability characteristics of a hermetically sealed GaAsP LED has been performed using accelerated life test techniques. A degradation model was developed based on the Arrhenius equation which was found to describe a lognormal failure distribution. The Extended-Longini failure mechanism was expanded to include the effects of crystalline dislocations.\",\"PeriodicalId\":369161,\"journal\":{\"name\":\"13th International Reliability Physics Symposium\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1975-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"13th International Reliability Physics Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.1975.362695\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"13th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1975.362695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A comprehensive study of the long life and reliability characteristics of a hermetically sealed GaAsP LED has been performed using accelerated life test techniques. A degradation model was developed based on the Arrhenius equation which was found to describe a lognormal failure distribution. The Extended-Longini failure mechanism was expanded to include the effects of crystalline dislocations.
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