逻辑测试中的计算复杂性

J. Sziray
{"title":"逻辑测试中的计算复杂性","authors":"J. Sziray","doi":"10.1109/INES.2010.5483865","DOIUrl":null,"url":null,"abstract":"The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.","PeriodicalId":118326,"journal":{"name":"2010 IEEE 14th International Conference on Intelligent Engineering Systems","volume":"494 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Computational complexity in logic testing\",\"authors\":\"J. Sziray\",\"doi\":\"10.1109/INES.2010.5483865\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.\",\"PeriodicalId\":118326,\"journal\":{\"name\":\"2010 IEEE 14th International Conference on Intelligent Engineering Systems\",\"volume\":\"494 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE 14th International Conference on Intelligent Engineering Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INES.2010.5483865\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE 14th International Conference on Intelligent Engineering Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INES.2010.5483865","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文从计算复杂度的角度对两种精确算法进行了分析和比较。两者都用于计算数字电路的故障检测测试。第一个是所谓的复合论证,第二个是d算法。分析将在门级的组合逻辑网络上进行。这里将考虑单个和多个卡在逻辑故障。结果表明,与d -算法及其修正相比,复合论证所需的计算步数明显减少。从这一事实可以得出结论,在这个领域可能没有其他的算法可以用更少的计算步骤。如果成立,则直接得出测试计算问题是指数时间问题,其他np完全问题也是指数时间问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Computational complexity in logic testing
The paper is concerned with analyzing and comparing two exact algorithms from the viewpoint of computational complexity. Both are for calculating fault-detection tests for digital circuits. The first one is the so-called composite justification, and the second is the D-algorithm. The analysis will be performed on combinational logic networks at the gate level. Here single and multiple stuck-at logic faults will be considered. As a result, it is pointed out that the composite justification requires significantly less computational step than the D-algorithm and its modifications. From this fact it has been concluded that possibly no other algorithm is available in this field with fewer computational steps. If it holds, then it follows directly that the test calculation problem is of exponential-time, and so are any other NP-complete problems.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信