考虑电源噪声的延迟静态压缩试验

23rd IEEE VLSI Test Symposium (VTS'05) Pub Date : 2005-05-01 DOI:10.1109/VTS.2005.77

Jing Wang, Xiang Lu, Wangqi Qiu, Ziding Yue, Steve Fancler, Weiping Shi, D. Walker

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引用次数: 31

摘要

过多的电源噪声会导致延迟测试时的过杀。本文描述了一种静态压缩算法来防止这种过度压缩。建立了电源噪声估计工具，并将其集成到压实过程中。给出了ISCAS89电路在不同电网环境下KLPG时延测试的压实结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Static compaction of delay tests considering power supply noise

Excessive power supply noise can lead to overkill during delay test. A static compaction algorithm is described in this paper that prevents such overkill. A power supply noise estimation tool has been built and integrated into the compaction process. Compaction results for KLPG delay tests for ISCAS89 circuits under different power grid environments are presented.

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23rd IEEE VLSI Test Symposium (VTS'05)

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