汽车半导体制造中设备评估方法及自动化管理系统

Z. Liu, Hongtao H. T. Qian, Yuhong Betsy Xu
{"title":"汽车半导体制造中设备评估方法及自动化管理系统","authors":"Z. Liu, Hongtao H. T. Qian, Yuhong Betsy Xu","doi":"10.1109/IEEM.2016.7798144","DOIUrl":null,"url":null,"abstract":"With the speedy developing of automotive market, the demand of automotive electronics semiconductor becomes more tremendous. Traditional semi-automatical equipment management method became unsuitable in semiconductor manufacturing. This paper tries to explain how to set up a high efficiency and accuracy assessment methodology on equipment performance to come out best tools on automotive semiconductor manufacturing. And this paper also show the systematical control of this methodology and obvious benefits compared with traditional methods.","PeriodicalId":114906,"journal":{"name":"2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Equipment assessment methodology and automatic management system in automotive semiconductor manufacturing\",\"authors\":\"Z. Liu, Hongtao H. T. Qian, Yuhong Betsy Xu\",\"doi\":\"10.1109/IEEM.2016.7798144\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the speedy developing of automotive market, the demand of automotive electronics semiconductor becomes more tremendous. Traditional semi-automatical equipment management method became unsuitable in semiconductor manufacturing. This paper tries to explain how to set up a high efficiency and accuracy assessment methodology on equipment performance to come out best tools on automotive semiconductor manufacturing. And this paper also show the systematical control of this methodology and obvious benefits compared with traditional methods.\",\"PeriodicalId\":114906,\"journal\":{\"name\":\"2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)\",\"volume\":\"96 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEEM.2016.7798144\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEEM.2016.7798144","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

随着汽车市场的快速发展,汽车电子半导体的需求量越来越大。传统的半自动化设备管理方法在半导体制造业中已不适用。本文试图解释如何建立一种高效、准确的设备性能评估方法,从而为汽车半导体制造提供最佳工具。本文还展示了该方法的系统性控制和与传统方法相比的明显效益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Equipment assessment methodology and automatic management system in automotive semiconductor manufacturing
With the speedy developing of automotive market, the demand of automotive electronics semiconductor becomes more tremendous. Traditional semi-automatical equipment management method became unsuitable in semiconductor manufacturing. This paper tries to explain how to set up a high efficiency and accuracy assessment methodology on equipment performance to come out best tools on automotive semiconductor manufacturing. And this paper also show the systematical control of this methodology and obvious benefits compared with traditional methods.
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