Wugang Tian, M. Pan, F. Luo, Song Jianbin, Dixiang Chen
{"title":"基于ARM单片机的内窥镜和涡流双重无损检测嵌入式系统","authors":"Wugang Tian, M. Pan, F. Luo, Song Jianbin, Dixiang Chen","doi":"10.1109/ICESS.2008.53","DOIUrl":null,"url":null,"abstract":"In this paper, based on ARM9 microcontroller S3C2440A and embedded operating system Windows CE, a new nondestructive system was established. The system uses borescope and eddy current testing dual techniques combined into a single probe, which takes advantage of borescope and eddy current testing. The system combines traditional nondestructive testing technology with some advanced technologies, such as digital signal processing, automatic testing and embedded system. The system has excellent characteristics of miniaturization, low power consumption, intelligence, etc. The hardware and software of the system are described. The system works successfully, the detection results are available. The system can meet the requirements of in situ nondestructive testing for equipments.","PeriodicalId":278372,"journal":{"name":"2008 International Conference on Embedded Software and Systems","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller\",\"authors\":\"Wugang Tian, M. Pan, F. Luo, Song Jianbin, Dixiang Chen\",\"doi\":\"10.1109/ICESS.2008.53\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, based on ARM9 microcontroller S3C2440A and embedded operating system Windows CE, a new nondestructive system was established. The system uses borescope and eddy current testing dual techniques combined into a single probe, which takes advantage of borescope and eddy current testing. The system combines traditional nondestructive testing technology with some advanced technologies, such as digital signal processing, automatic testing and embedded system. The system has excellent characteristics of miniaturization, low power consumption, intelligence, etc. The hardware and software of the system are described. The system works successfully, the detection results are available. The system can meet the requirements of in situ nondestructive testing for equipments.\",\"PeriodicalId\":278372,\"journal\":{\"name\":\"2008 International Conference on Embedded Software and Systems\",\"volume\":\"90 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-07-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 International Conference on Embedded Software and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICESS.2008.53\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 International Conference on Embedded Software and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICESS.2008.53","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller
In this paper, based on ARM9 microcontroller S3C2440A and embedded operating system Windows CE, a new nondestructive system was established. The system uses borescope and eddy current testing dual techniques combined into a single probe, which takes advantage of borescope and eddy current testing. The system combines traditional nondestructive testing technology with some advanced technologies, such as digital signal processing, automatic testing and embedded system. The system has excellent characteristics of miniaturization, low power consumption, intelligence, etc. The hardware and software of the system are described. The system works successfully, the detection results are available. The system can meet the requirements of in situ nondestructive testing for equipments.