x射线光刻:最近的进展和未来的发展

K. Suzuki
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摘要

几种形式的光刻,如x射线光刻(XRL),投影电子束光刻(SCALPEL)和投影离子束光刻(IPL),目前正在开发用于低于0.1 pm规则的ULSl制造。这些技术的共同特点是使用薄膜或模板。其中,x射线掩模最简单,结构最紧凑,便于实际应用。最近的实验和模拟数据表明,XRL可能允许每小时高达50片晶圆(48英寸)的实际吞吐量。此外,XRL提供了非常大的工艺余量,对低于0.1 pm的粉尘不敏感。这些优越的特性将使未来超低成本的ULSl制造成为可能。另一方面,用于0.1 pm以下器件制造的x射线掩模所需的模式放置精度小于f10 nm。如SIA路线图所述,这种器件制造所需的现场尺寸预计约为25 X 40 mm。这样的模式放置精度对应于小于0.5 ppm的掩模失真。在x射线光刻技术的几个关键问题中,研制这种高精度的x射线掩模是当务之急。因此,针对x射线掩模材料和制造工艺进行了大量的研究和开发。通过这样的努力,开发出了能够制造0.1 pm- ulsi的极具前景的x射线掩模材料和掩模制造工艺。在本文中,我们将报告x射线掩膜材料的最新进展,例如低应力和均匀应力x射线吸收材料(无定形TaGe '或TaReGe3),极低应力CrN硬掩膜和高杨氏模量抗辐射膜的发展。我们还将回顾关键仪器的进展,如紧凑的正导磁体同步加速器,高传输效率和均匀光束线,以及高通量x射线步进器。然后,我们将研究剩下的问题,并讨论将x射线光刻技术投入大规模生产还需要做些什么。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
X-Ray Lithography: Recent Progress And Future Developments
Several forms o f lithography, such as x-ray lithography (XRL), projection electron beam lithography (SCALPEL), and projection ion-beam lithography (IPL), are now being developed for sub-0.1 -pm-rule ULSl fabrication. The common feature of these technologies is t ha t they use membraneo r stencil-masks. Among them, the x-ray mask is the simplest and most compact, which are advantages fo r practical use. Recent experimental and simulation data indicates that XRL may allow a practical throughput as high as 50 wafers (48’’ ) per hour. In addition, XRL provides a very large process margin and is insensitive t o sub-0.1-pm dust. These superior characteristics will enable low cost fabrication of ULSl in the future. On the other hand, the pattern-placement accuracy required for x-ray masks used fo r sub-0.1-pm device fabrication is less than f10 nm. The field size required for such device fabrication is expected t o be about 25 X 4 0 mm, as described in the SIA Roadmap.’ Such pattern-placement accuracy corresponds t o mask distortion of less than 0.5 ppm. Among the several key issues concerning x-ray lithography technology, the development of such high precision x-ray masks is the f i rs t priority. For this reason, a great deal of research and development aimed a t both x-ray mask materials and the fabrication processes has been carried out. Owing t o such efforts, very promising x-ray mask materials and mask-fabrication processes, which will make 0.1 -pm-ULSI fabrication a reality, have been developed. In this paper, we will report the recent progress in x-ray mask materials, such as the development of lowand uniform-stress x-ray absorbers (amorphous TaGe’ or TaReGe3), extremely low stress CrN hard-masks4, and high Young’s modulus radiation-resistant membranes. We will also review the progress of key instruments, such as a compact synchrotron with normal-conducting magnet, high-transmission efficiency and uniform beamlines, and high-throughput x-ray steppers. We will then examine the remaining issues, and discuss what sti l l has t o be done t o put x-ray lithography into mass production.
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