{"title":"DMOS单元几何形状对高压功率mosfet集成电流传感器的影响","authors":"R. Zhu, T. P. Chow","doi":"10.1109/ISPSD.1996.509478","DOIUrl":null,"url":null,"abstract":"The integrated current-sensing power MOSFET is used in power electronics to implement system control, protective and diagnostic function. This paper compares integrated current-sensing power MOSFETs with the square (SQ) and atomic-lattice-layout (ALL) design. It is shown that the ALL design offers better performance than that with the SQ cell design.","PeriodicalId":377997,"journal":{"name":"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"The effect of DMOS cell geometry on the integrated current sensors of high-voltage power MOSFETs\",\"authors\":\"R. Zhu, T. P. Chow\",\"doi\":\"10.1109/ISPSD.1996.509478\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The integrated current-sensing power MOSFET is used in power electronics to implement system control, protective and diagnostic function. This paper compares integrated current-sensing power MOSFETs with the square (SQ) and atomic-lattice-layout (ALL) design. It is shown that the ALL design offers better performance than that with the SQ cell design.\",\"PeriodicalId\":377997,\"journal\":{\"name\":\"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPSD.1996.509478\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"8th International Symposium on Power Semiconductor Devices and ICs. ISPSD '96. Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1996.509478","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of DMOS cell geometry on the integrated current sensors of high-voltage power MOSFETs
The integrated current-sensing power MOSFET is used in power electronics to implement system control, protective and diagnostic function. This paper compares integrated current-sensing power MOSFETs with the square (SQ) and atomic-lattice-layout (ALL) design. It is shown that the ALL design offers better performance than that with the SQ cell design.