浸银工艺中几个因素与电蚀问题关系的研究

Kun Li, D. Xiang, X. Liu
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引用次数: 0

摘要

为了控制铅污染,传统的含铅PCB(印刷电路板)表面处理技术“热风焊流平”(HASL)需要被无铅技术所取代。与其他无铅技术相比,浸银技术具有许多优点,因此得到了越来越广泛的应用。然而,“电侵”问题严重侵蚀电路连接处的铜,严重阻碍了银离子的普及。根据制造经验,银离子浓度、温度、微蚀速率和液面是影响银工艺的四个主要因素。本文通过实验研究了这些因素与电激侵蚀的关系。从这些关系中可以得到工程实践中减少电蚀的启示。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of Relations between Several Factors in Immersion Silver Technique and Galvanic Attack Problem
To control lead pollution," Hot Air Solder Leveling "(HASL), the traditional lead-contained PCB(Printed Circuit Board) surface finish, needs to be replaced by lead- free technique. Immersion Silver (I-Ag) has many merits compared to other lead-free techniques, thereby being increasingly widely used. However, a problem named "galvanic attack", which seriously erodes copper where circuit connects pad, is a serious obstacle to I-Ag's popularization. According to manufacturing experience, consistency of silver ion, temperature, mircoetch rate and liquid level are four major factors in I-Ag process. In this paper, relations between these factors and galvanic attack are studied by experiments. From these relations we get inspirations to reduce galvanic attack in engineering practice.
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