有些故障需要I/sub ddq/ test

S. Makar, E. McCluskey
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引用次数: 5

摘要

给出了2-1多路复用器和d锁存器不同实现方式的故障仿真结果。这些结果表明,有些故障只能通过I/sub ddq/ test检测出来。仿真结果还表明,I/sub / ddq/作为一种测试方法的“重要性”随着实现的不同而有很大的不同。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Some faults need an I/sub ddq/ test
Fault Simulation results of different implementations of 2-1 multiplexers and D-latches are presented. These results show that some faults can only be detected by I/sub ddq/ test. Simulation results also show that the "importance" of I/sub ddq/ as a test method can vary considerably with implementation.
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