M. Deng, S. Frégonèse, D. Céli, P. Chevalier, M. De matos, T. Zimmer
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Design of Silicon On-Wafer Sub-THz Calibration Kit
On-wafer TRL calibration kits were developed in STMicroelectronics BiCMOS55 technology. Standard straight lines and meander lines topologies were investigated and compared together through a SiGe HBT characterization up to 220 GHz.
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