最大长度寄存器和循环移位寄存器动态特性的比较

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208168

R. Seireg, A. Vacroux

{"title":"最大长度寄存器和循环移位寄存器动态特性的比较","authors":"R. Seireg, A. Vacroux","doi":"10.1109/VTEST.1991.208168","DOIUrl":null,"url":null,"abstract":"The study of the performance of maximum length and cyclic shift registers has been extended to broader classes of circuits. A new general form for the characteristic equation of the transition probability matrix was deduced which differs from equations obtained earlier.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Comparison between the dynamic behavior of maximum length and cyclic shift registers\",\"authors\":\"R. Seireg, A. Vacroux\",\"doi\":\"10.1109/VTEST.1991.208168\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The study of the performance of maximum length and cyclic shift registers has been extended to broader classes of circuits. A new general form for the characteristic equation of the transition probability matrix was deduced which differs from equations obtained earlier.<<ETX>>\",\"PeriodicalId\":157539,\"journal\":{\"name\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1991.208168\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208168","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

对最大长度寄存器和循环移位寄存器性能的研究已经扩展到更广泛的电路类别。推导出了一种不同于以往的转移概率矩阵特征方程的新的一般形式。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Comparison between the dynamic behavior of maximum length and cyclic shift registers

The study of the performance of maximum length and cyclic shift registers has been extended to broader classes of circuits. A new general form for the characteristic equation of the transition probability matrix was deduced which differs from equations obtained earlier.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

自引率

0.00%

发文量