R. Weerasekera, Lirong Zheng, D. Pamunuwa, H. Tenhunen
{"title":"串扰免疫互连驱动设计","authors":"R. Weerasekera, Lirong Zheng, D. Pamunuwa, H. Tenhunen","doi":"10.1109/ISSOC.2004.1411168","DOIUrl":null,"url":null,"abstract":"The effect of crosstalk noise becomes increasingly significant as geometries continue to shrink into the deep sub-micrometer regime and clock-frequency increases into the multi GHz domain. Dynamic delay caused by coupling capacitance between adjacent interconnections is a critical problem, as it cannot accurately be estimated in static timing analysis. This work presents a new driver circuit scheme called the crosstalk immune interconnect driver (XTIID), for capacitively coupled interconnects, which eliminates pattern-dependent coupling noise. Also, such an interconnect drive technology has the potential to facilitate the dynamic timing problem in deep submicrometer VLSI design.","PeriodicalId":268122,"journal":{"name":"2004 International Symposium on System-on-Chip, 2004. Proceedings.","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Crosstalk immune interconnect driver design\",\"authors\":\"R. Weerasekera, Lirong Zheng, D. Pamunuwa, H. Tenhunen\",\"doi\":\"10.1109/ISSOC.2004.1411168\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The effect of crosstalk noise becomes increasingly significant as geometries continue to shrink into the deep sub-micrometer regime and clock-frequency increases into the multi GHz domain. Dynamic delay caused by coupling capacitance between adjacent interconnections is a critical problem, as it cannot accurately be estimated in static timing analysis. This work presents a new driver circuit scheme called the crosstalk immune interconnect driver (XTIID), for capacitively coupled interconnects, which eliminates pattern-dependent coupling noise. Also, such an interconnect drive technology has the potential to facilitate the dynamic timing problem in deep submicrometer VLSI design.\",\"PeriodicalId\":268122,\"journal\":{\"name\":\"2004 International Symposium on System-on-Chip, 2004. Proceedings.\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 International Symposium on System-on-Chip, 2004. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSOC.2004.1411168\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 International Symposium on System-on-Chip, 2004. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSOC.2004.1411168","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The effect of crosstalk noise becomes increasingly significant as geometries continue to shrink into the deep sub-micrometer regime and clock-frequency increases into the multi GHz domain. Dynamic delay caused by coupling capacitance between adjacent interconnections is a critical problem, as it cannot accurately be estimated in static timing analysis. This work presents a new driver circuit scheme called the crosstalk immune interconnect driver (XTIID), for capacitively coupled interconnects, which eliminates pattern-dependent coupling noise. Also, such an interconnect drive technology has the potential to facilitate the dynamic timing problem in deep submicrometer VLSI design.