超高频RFID芯片阻抗和灵敏度测量采用传输线变压器

Florian Muralter, Michael Hani, H. Landaluce, A. Perallos, Erwin M. Biebl
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引用次数: 0

摘要

本文描述了测量超高频(UHF)射频识别(RFID)芯片阻抗并找到其转折点的另一种方法。所提出的方法是基于使用标准矢量网络分析仪(VNA)和定制的印刷电路板(PCB)测试夹具测量RFID芯片的平衡阻抗。测试夹具使用传输线变压器(1)为RFID芯片的端口提供平衡信号,(2)实现预匹配,以避免使用VNA测量高Q分量导致的不准确性。不需要额外的RFID阅读器,因为拐点是从作为频率和输入功率的函数的测量电压反射系数中提取的。利用史密斯图方法设计了一个匹配网络,通过测量反射系数来证明该方法的适用性。提供了与典型使用的单端技术的比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
UHF RFID chip impedance and sensitivity measurement using a transmission line transformer
This article describes an alternative procedure for measuring the impedance of an ultra high frequency (UHF) radio frequency identification (RFID) chip and finding its turnon-point. The proposed method is based on measuring the balanced impedance of the RFID chip using a standard vector network analyzer (VNA) and a custom fabricated printed circuit board (PCB) test fixture. The test fixture uses a transmission line transformer to (1) provide a balanced signal to the ports of the RFID chip and (2) achieve a pre-matching to avoid the inaccuracies resulting from measuring high Q components with a VNA. No additional RFID reader is needed, as the turnon-point is extracted from the measured voltage reflection coefficient as a function of frequency and input power. A matching network is designed using a Smith chart approach to prove the applicability of the method by measuring the resulting reflection coefficient. A comparison with the typically used single-ended technique is provided.
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