Florian Muralter, Michael Hani, H. Landaluce, A. Perallos, Erwin M. Biebl
{"title":"超高频RFID芯片阻抗和灵敏度测量采用传输线变压器","authors":"Florian Muralter, Michael Hani, H. Landaluce, A. Perallos, Erwin M. Biebl","doi":"10.1109/RFID52461.2021.9444382","DOIUrl":null,"url":null,"abstract":"This article describes an alternative procedure for measuring the impedance of an ultra high frequency (UHF) radio frequency identification (RFID) chip and finding its turnon-point. The proposed method is based on measuring the balanced impedance of the RFID chip using a standard vector network analyzer (VNA) and a custom fabricated printed circuit board (PCB) test fixture. The test fixture uses a transmission line transformer to (1) provide a balanced signal to the ports of the RFID chip and (2) achieve a pre-matching to avoid the inaccuracies resulting from measuring high Q components with a VNA. No additional RFID reader is needed, as the turnon-point is extracted from the measured voltage reflection coefficient as a function of frequency and input power. A matching network is designed using a Smith chart approach to prove the applicability of the method by measuring the resulting reflection coefficient. A comparison with the typically used single-ended technique is provided.","PeriodicalId":358808,"journal":{"name":"2021 IEEE International Conference on RFID (RFID)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"UHF RFID chip impedance and sensitivity measurement using a transmission line transformer\",\"authors\":\"Florian Muralter, Michael Hani, H. Landaluce, A. Perallos, Erwin M. Biebl\",\"doi\":\"10.1109/RFID52461.2021.9444382\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article describes an alternative procedure for measuring the impedance of an ultra high frequency (UHF) radio frequency identification (RFID) chip and finding its turnon-point. The proposed method is based on measuring the balanced impedance of the RFID chip using a standard vector network analyzer (VNA) and a custom fabricated printed circuit board (PCB) test fixture. The test fixture uses a transmission line transformer to (1) provide a balanced signal to the ports of the RFID chip and (2) achieve a pre-matching to avoid the inaccuracies resulting from measuring high Q components with a VNA. No additional RFID reader is needed, as the turnon-point is extracted from the measured voltage reflection coefficient as a function of frequency and input power. A matching network is designed using a Smith chart approach to prove the applicability of the method by measuring the resulting reflection coefficient. A comparison with the typically used single-ended technique is provided.\",\"PeriodicalId\":358808,\"journal\":{\"name\":\"2021 IEEE International Conference on RFID (RFID)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-04-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Conference on RFID (RFID)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RFID52461.2021.9444382\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Conference on RFID (RFID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RFID52461.2021.9444382","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
UHF RFID chip impedance and sensitivity measurement using a transmission line transformer
This article describes an alternative procedure for measuring the impedance of an ultra high frequency (UHF) radio frequency identification (RFID) chip and finding its turnon-point. The proposed method is based on measuring the balanced impedance of the RFID chip using a standard vector network analyzer (VNA) and a custom fabricated printed circuit board (PCB) test fixture. The test fixture uses a transmission line transformer to (1) provide a balanced signal to the ports of the RFID chip and (2) achieve a pre-matching to avoid the inaccuracies resulting from measuring high Q components with a VNA. No additional RFID reader is needed, as the turnon-point is extracted from the measured voltage reflection coefficient as a function of frequency and input power. A matching network is designed using a Smith chart approach to prove the applicability of the method by measuring the resulting reflection coefficient. A comparison with the typically used single-ended technique is provided.