400/533Mbps DDR-II SDRAM存储器互连总线的设计与仿真

M. Sharawi, M. Al-Qdah
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引用次数: 9

摘要

当今计算机系统性能的一个主要瓶颈是主存储器总线的速度。存储器总线应该精心设计,以获得良好的信号完整性(SI)和时序性能。本文介绍了一种工作速度为400/ 533mbps的双数据速率同步动态RAM (DDR-II SDRAM)存储器总线的设计、建模和仿真。从符号间干扰(ISI)和眼宽(EW)的角度对三种总线拓扑进行了研究和比较。与传统的主板终止(MBT)方案相比,具有片上终止(ODT)的拓扑结构在ISI减少方面提高了约95%,在400mbps数据速率的最坏情况下写入和读取操作的眼宽方面分别提高了约37%和12%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The design and simulation of a 400/533Mbps DDR-II SDRAM memory interconnect bus
A major bottleneck in todaypsilas computer system performance is the speed of the main memory bus. A memory bus should be carefully designed for good signal integrity (SI) and timing performance. This paper presents the design, modelling and simulation of a double data rate synchronous dynamic RAM (DDR-II SDRAM) memory bus operating at 400/533 Mbps. Three bus topologies are investigated and compared in terms of the amount of inter-symbol-interference (ISI) and the eye-width (EW). The topology with on-die-termination (ODT) gave about 95% improvement in ISI reduction, and about 37% and 12% improvement in the eye-width for the worst case write and read operations for the 400 Mbps data rate, respectively, when compared to the conventional mother board termination (MBT) scheme.
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