硅微通道板电子倍增器的实验研究

Q. Duanmu, Guozheng Wang, Ye Li, Yang Wang, Hongchang Cheng, Xulei Qin, Zhenhua Jiang, D. Jiang
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引用次数: 0

摘要

采用光辅助电化学蚀刻工艺制备了高纵横比的硅微通道阵列。研究了硅各向异性刻蚀机理、工艺参数、诱导坑阵列和沟道形貌,并讨论了稳定生长微沟道的刻蚀电流密度条件。采用LPCVD工艺制备了连续SiO2薄膜阳极。研究并制备了薄膜的绝缘、导电和电子发射层。在680V工作电压下,获得了板径为25 mm、通道边长为4 ~ 6 μm、通道间距为1 ~ 2 μm、宽高比大于40、通道偏置角为7°、电子增益为165的硅微通道板样品。对硅微通道板的实验研究表明,本文所提出的硅微通道板工艺是可行的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Experimental investigation on silicon microchannel plate electron multiplier
A Silicon microchannel arrays with the very high aspect ratio was prepared by the photo-assisted electrochemical etching process. The mechanism of silicon anisotropy etching, the process parameters, the inducing pit arrays and the channel morphology were investigated, and the condition of etching current density for steady microchannel growth was discussed. The continuous SiO2 thin film dynode was fabricated by LPCVD process. The insulation, conductive and electron emission layer of the dynodes were studied and prepared. We obtained the samples of silicon microchannel plate with 25 mm of the plate diameter, 4-6 μm of channel side size, 1-2 μm of the channel space, more than 40 of aspect ratio, 7° channel bias angle, and 165 of the electron gain at 680V working voltage. The experimental study on silicon microchannel plate indicates that the process of Silicon microchannel plate in this paper is feasible.
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