{"title":"基于马尔可夫链蒙特卡罗的设备级电磁脉冲效应贝叶斯评估方法","authors":"C. Yuhao, Liu Kejie, Xie Yanzhao","doi":"10.1109/APEMC.2016.7522828","DOIUrl":null,"url":null,"abstract":"To assess the susceptibility of device under electromagnetic pulse (EMP) environment, simulation test is believed as an effective method. But during simulation tests, few data can be obtained to assess effect. This paper presents an effect threshold model of a communication device based on Bayesian method. The model parameters are optimized by Markov Chain Monte Carlo (MCMC) algorithm.","PeriodicalId":358257,"journal":{"name":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"173 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Bayesian assessment method of device-level electromagnetic pulse effect based on Markov Chain Monte Carlo\",\"authors\":\"C. Yuhao, Liu Kejie, Xie Yanzhao\",\"doi\":\"10.1109/APEMC.2016.7522828\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"To assess the susceptibility of device under electromagnetic pulse (EMP) environment, simulation test is believed as an effective method. But during simulation tests, few data can be obtained to assess effect. This paper presents an effect threshold model of a communication device based on Bayesian method. The model parameters are optimized by Markov Chain Monte Carlo (MCMC) algorithm.\",\"PeriodicalId\":358257,\"journal\":{\"name\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"volume\":\"173 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APEMC.2016.7522828\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEMC.2016.7522828","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Bayesian assessment method of device-level electromagnetic pulse effect based on Markov Chain Monte Carlo
To assess the susceptibility of device under electromagnetic pulse (EMP) environment, simulation test is believed as an effective method. But during simulation tests, few data can be obtained to assess effect. This paper presents an effect threshold model of a communication device based on Bayesian method. The model parameters are optimized by Markov Chain Monte Carlo (MCMC) algorithm.