{"title":"软件故障归责程序的比较","authors":"J. V. Hulse, T. Khoshgoftaar, Chris Seiffert","doi":"10.1109/ICMLA.2006.5","DOIUrl":null,"url":null,"abstract":"This work presents a detailed comparison of three imputation techniques, Bayesian multiple imputation, regression imputation and k nearest neighbor imputation, at various missingness levels. Starting with a complete real-world software measurement dataset called CCCS, missing values were injected into the dependent variable at four levels according to three different missingness mechanisms. The three imputation techniques are evaluated by comparing the imputed and actual values. Our analysis includes a three-way analysis of variance (ANOVA) model, which demonstrates that Bayesian multiple imputation obtains the best performance, followed closely by regression","PeriodicalId":297071,"journal":{"name":"2006 5th International Conference on Machine Learning and Applications (ICMLA'06)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"A Comparison of Software Fault Imputation Procedures\",\"authors\":\"J. V. Hulse, T. Khoshgoftaar, Chris Seiffert\",\"doi\":\"10.1109/ICMLA.2006.5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a detailed comparison of three imputation techniques, Bayesian multiple imputation, regression imputation and k nearest neighbor imputation, at various missingness levels. Starting with a complete real-world software measurement dataset called CCCS, missing values were injected into the dependent variable at four levels according to three different missingness mechanisms. The three imputation techniques are evaluated by comparing the imputed and actual values. Our analysis includes a three-way analysis of variance (ANOVA) model, which demonstrates that Bayesian multiple imputation obtains the best performance, followed closely by regression\",\"PeriodicalId\":297071,\"journal\":{\"name\":\"2006 5th International Conference on Machine Learning and Applications (ICMLA'06)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-12-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 5th International Conference on Machine Learning and Applications (ICMLA'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMLA.2006.5\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 5th International Conference on Machine Learning and Applications (ICMLA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMLA.2006.5","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Comparison of Software Fault Imputation Procedures
This work presents a detailed comparison of three imputation techniques, Bayesian multiple imputation, regression imputation and k nearest neighbor imputation, at various missingness levels. Starting with a complete real-world software measurement dataset called CCCS, missing values were injected into the dependent variable at four levels according to three different missingness mechanisms. The three imputation techniques are evaluated by comparing the imputed and actual values. Our analysis includes a three-way analysis of variance (ANOVA) model, which demonstrates that Bayesian multiple imputation obtains the best performance, followed closely by regression