IGBT热参数测量方法的特性研究

2020 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES) Pub Date : 2020-06-01 DOI:10.23919/MIXDES49814.2020.9155824

K. Górecki, P. Górecki

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引用次数: 1

摘要

本文分析了电学和光学测量方法在确定IGBT热参数可靠值方面的作用。讨论了影响所考虑方法测量误差的因素。给出并讨论了用所考虑的方法对被测晶体管的不同冷却条件下所得到的所考虑的参数的测量结果。结果表明，在何种操作条件下，每种测量方法都可以获得可靠的结果。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Investigations Properties of Selected Methods of Measurements of Thermal Parameters of the IGBT

In this paper usefulness of electric and optical measurement methods to determine reliably values of thermal parameters of the IGBT is analysed. Factors influencing a measuring error of the considered methods are discussed. The results of measurements of the considered parameters obtained with the use of the considered methods for different cooling conditions of the tested transistor are presented and discussed. It is shown, in what operating conditions each measuring method makes it possible to obtain reliable results.

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2020 27th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)

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