随机载荷下随机疲劳可靠性量化的统一方法

Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity Pub Date : 1998-01-19 DOI:10.1109/RAMS.1998.653797

D. Kececioglu, Mingxiao Jiang, Fengbin Sun

{"title":"随机载荷下随机疲劳可靠性量化的统一方法","authors":"D. Kececioglu, Mingxiao Jiang, Fengbin Sun","doi":"10.1109/RAMS.1998.653797","DOIUrl":null,"url":null,"abstract":"The random fatigue damage accumulation under stationary random loading, narrow-band or wide-band, has been quantified by numerous authors. It is shown in this paper that their results can be applied to random fatigue crack growth under random loading. The random fatigue life distribution is obtained, which is found to be a Birnbaum-Saunder's distribution. Then, the fatigue life statistics and the associated reliability are quantified.","PeriodicalId":275301,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"A unified approach to random-fatigue reliability quantification under random loading\",\"authors\":\"D. Kececioglu, Mingxiao Jiang, Fengbin Sun\",\"doi\":\"10.1109/RAMS.1998.653797\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The random fatigue damage accumulation under stationary random loading, narrow-band or wide-band, has been quantified by numerous authors. It is shown in this paper that their results can be applied to random fatigue crack growth under random loading. The random fatigue life distribution is obtained, which is found to be a Birnbaum-Saunder's distribution. Then, the fatigue life statistics and the associated reliability are quantified.\",\"PeriodicalId\":275301,\"journal\":{\"name\":\"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-01-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RAMS.1998.653797\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.1998.653797","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 17

摘要

许多作者已经对固定随机载荷下的随机疲劳损伤积累进行了量化。结果表明，这些结果可以应用于随机载荷作用下的随机疲劳裂纹扩展。得到了随机疲劳寿命分布，该分布符合Birnbaum-Saunder分布。然后，对疲劳寿命统计量和相关可靠性进行量化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

A unified approach to random-fatigue reliability quantification under random loading

The random fatigue damage accumulation under stationary random loading, narrow-band or wide-band, has been quantified by numerous authors. It is shown in this paper that their results can be applied to random fatigue crack growth under random loading. The random fatigue life distribution is obtained, which is found to be a Birnbaum-Saunder's distribution. Then, the fatigue life statistics and the associated reliability are quantified.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Annual Reliability and Maintainability Symposium. 1998 Proceedings. International Symposium on Product Quality and Integrity

自引率

0.00%

发文量