{"title":"可靠性设计:一种基于FPGA的高质量应用的新型计数器矩阵代码","authors":"Ahilan Appathurai, P. Deepa","doi":"10.1109/ACQED.2015.7274007","DOIUrl":null,"url":null,"abstract":"The scaling down of semiconductor technology in FPGA increases the soft errors due to radiation effects in space. To address this technological challenge a novel coding technique, Counter Matrix Code (CMC) is proposed to protect the SRAM based FPGA's configuration memories (FCM) against radiation induced Multiple Bit Upsets (MBU) with Low cost and maximum correction capability. The proposed CMC is experimentally studied for its efficiency and reliability. The proposed technique improves the reliability of the memory by more than 7× compared to traditional HC technique and more than 4× compared to MC and more than 2× compared to DMC. The cost of the proposed work is less than traditional DMC and MC.","PeriodicalId":376857,"journal":{"name":"2015 6th Asia Symposium on Quality Electronic Design (ASQED)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":"{\"title\":\"Design for reliablity: A novel counter matrix code for FPGA based quality applications\",\"authors\":\"Ahilan Appathurai, P. Deepa\",\"doi\":\"10.1109/ACQED.2015.7274007\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The scaling down of semiconductor technology in FPGA increases the soft errors due to radiation effects in space. To address this technological challenge a novel coding technique, Counter Matrix Code (CMC) is proposed to protect the SRAM based FPGA's configuration memories (FCM) against radiation induced Multiple Bit Upsets (MBU) with Low cost and maximum correction capability. The proposed CMC is experimentally studied for its efficiency and reliability. The proposed technique improves the reliability of the memory by more than 7× compared to traditional HC technique and more than 4× compared to MC and more than 2× compared to DMC. The cost of the proposed work is less than traditional DMC and MC.\",\"PeriodicalId\":376857,\"journal\":{\"name\":\"2015 6th Asia Symposium on Quality Electronic Design (ASQED)\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-09-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"17\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 6th Asia Symposium on Quality Electronic Design (ASQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ACQED.2015.7274007\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 6th Asia Symposium on Quality Electronic Design (ASQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACQED.2015.7274007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design for reliablity: A novel counter matrix code for FPGA based quality applications
The scaling down of semiconductor technology in FPGA increases the soft errors due to radiation effects in space. To address this technological challenge a novel coding technique, Counter Matrix Code (CMC) is proposed to protect the SRAM based FPGA's configuration memories (FCM) against radiation induced Multiple Bit Upsets (MBU) with Low cost and maximum correction capability. The proposed CMC is experimentally studied for its efficiency and reliability. The proposed technique improves the reliability of the memory by more than 7× compared to traditional HC technique and more than 4× compared to MC and more than 2× compared to DMC. The cost of the proposed work is less than traditional DMC and MC.