片上并行性的实证研究

M. L. Bailey, L. Snyder
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引用次数: 36

摘要

提出了一种经验确定CMOS VLSI芯片并行度的方法。对六个芯片进行了测试,研究了输入选择和电路尺寸的影响。这里测量的出乎意料的低并行性表明,并行模拟器的某些策略可能注定要失败,并且早期将并行性从小型电路外推到大型电路的努力可能过于乐观。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An empirical study of on-chip parallelism
A methodology is presented for empirically determining the amount of parallelism on a CMOS VLSI chip. Six chips are measured, and the effect of input choice and circuit size is studied. The unexpectedly low parallelism measured here suggests that certain strategies for parallel simulators may be doomed, and earlier efforts to extrapolate parallelism from small circuits to large circuits may have been overly optimistic.<>
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