利用SCAPS-1D软件对无毒ZnSe缓冲层提高Sb2S3太阳能电池效率的数值模拟

Md. Abdul Halim, Sunirmal Kumar Biswas, Md. Shafiqul Islam, Mostak Ahmed
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引用次数: 5

摘要

在自然资源利用多样化的背景下,使用可再生能源,特别是太阳能光伏,已变得越来越必要。由于其1.65 eV的带隙和大于105 cm-1的高吸收系数,Sb2S3成为当今薄膜太阳能电池的一个有吸引力的候选者。硫化镉是薄膜太阳能电池中最常用的缓冲层材料,但镉是一种对人类和环境造成严重毒性的金属。本文试图在太阳能电池生产中避免使用镉。本文利用SCAPS-1D模拟软件对(Sb2S3/ZnSe/i-ZnO/ZnO: Al)结构中基于p型Sb2S3吸收层和n型ZnSe缓冲层的薄膜太阳能电池进行了计算机模拟分析。仿真包括吸收层厚度、缓冲层厚度、缺陷密度、温度和串联并联电阻的详细配置优化。在这项工作中,通过改变吸收层的厚度(0.5µm至4µm)和改变缓冲层的厚度(0.05µm至0.1µm),测量了效率(η)、填充因子(FF)、开路电压(Voc)和短路电流(Jsc)。当吸收层厚度为4µm,缓冲层厚度为0.08µm时,优化后的太阳能电池效率为20.03%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Numerical Simulation of Non-toxic ZnSe Buffer Layer to Enhance Sb2S3 Solar Cell Efficiency Using SCAPS-1D Software
The use of renewable energy, especially solar photovoltaic, has grown more and more necessary in the context of the diversification of the use of natural resources. Sb2S3 is emerged as an attractive candidate for today's thin-film solar cells due to its band gap of 1.65 eV and high absorption coefficient greater than 105 cm-1. Cadmium Sulfide is the most commonly used buffer layer material in thin film solar cells, but cadmium is a metal that causes severe toxicity in humans and the environment. This article tried to avoid cadmium for solar cell generation. This paper presents the findings of a computer simulation analysis of a thin film solar cell based on a p-type Sb2S3 absorber layer and an n-type ZnSe buffer layer in a structure of (Sb2S3/ZnSe/i-ZnO/ZnO: Al) utilizing simulation software (SCAPS-1D). The simulation included detailed configuration optimization for the thickness of the absorber layer, buffer layer, defect density, temperature, and series-shunt resistance. In this work, the Efficiency (η), Fill Factor (FF), Open-circuit Voltage (Voc), and short-circuit current (Jsc) have been measured by varying thickness of absorber layer in the range of 0.5µm to 4 µm and by varying thickness of buffer layer in the range of 0.05 µm to 0.1µm. The optimized solar cell shows an efficiency of 20.03% when the absorber layer thickness is 4µm and the buffer layer thickness is 0.08µm.
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