{"title":"灾难性断层的识别","authors":"A. Nayak, L. Pagli, N. Santoro","doi":"10.1109/DFTVS.1992.224370","DOIUrl":null,"url":null,"abstract":"For a given design, it is not difficult to identify a set of elements whose failure will have catastrophic consequence. There exist many patterns (random distribution) of faults, not in a block, which can be fatal for the system. Therefore, the characterization of such fault patterns is crucial for the identification, testing and detection of such catastrophic events. This paper, is concerned with the development of efficient recognition schemes; that is, efficient mechanisms which automatically determine whether or not an observed/detected pattern of faults will have catastrophic consequences. The problem of recognizing whether a fault pattern is catastrophic has been addressed.<<ETX>>","PeriodicalId":319218,"journal":{"name":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Recognition of catastrophic faults\",\"authors\":\"A. Nayak, L. Pagli, N. Santoro\",\"doi\":\"10.1109/DFTVS.1992.224370\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For a given design, it is not difficult to identify a set of elements whose failure will have catastrophic consequence. There exist many patterns (random distribution) of faults, not in a block, which can be fatal for the system. Therefore, the characterization of such fault patterns is crucial for the identification, testing and detection of such catastrophic events. This paper, is concerned with the development of efficient recognition schemes; that is, efficient mechanisms which automatically determine whether or not an observed/detected pattern of faults will have catastrophic consequences. The problem of recognizing whether a fault pattern is catastrophic has been addressed.<<ETX>>\",\"PeriodicalId\":319218,\"journal\":{\"name\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1992.224370\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1992.224370","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
For a given design, it is not difficult to identify a set of elements whose failure will have catastrophic consequence. There exist many patterns (random distribution) of faults, not in a block, which can be fatal for the system. Therefore, the characterization of such fault patterns is crucial for the identification, testing and detection of such catastrophic events. This paper, is concerned with the development of efficient recognition schemes; that is, efficient mechanisms which automatically determine whether or not an observed/detected pattern of faults will have catastrophic consequences. The problem of recognizing whether a fault pattern is catastrophic has been addressed.<>