全数字锁相环,输入时钟故障检测器

T. Aswathi, P. Sathishkumar
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引用次数: 3

摘要

全数字锁相环作为时钟发生器广泛应用于芯片上的多处理器系统。错误检测系统对于这样的时钟生成器至关重要,因为它可以用来通知不同的处理器关闭,以防止错误时钟的传播。在这项工作中,提出了一个改进的输入时钟故障检测器的全数字锁相环。本文提出的全数字锁相环工作频率为61KHz ~ 42Mhz。设计采用了完全数字化的方法。该设计在不到5个参考周期内实现锁定。输入时钟故障检测电路检测输入信号丢失并通知控制器。故障检测在早期阶段是可能的,因此,只需要2个数字控制振荡器时钟周期用于故障检测,1个参考时钟周期用于超出限制的故障检测。整个设计是在Verilog硬件描述语言中完成的,因此它是高度通用的。合成使用cadence RTL编译器完成。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
All digital phase locked loop with input clock fail detector
All Digital Phase Locked Loops are widely used as clock generators in multiprocessor system on chips. An error detection system is crucial for such clock generators since it can be used to notify different processors to shut down so as to prevent the propagation of a faulty clock. In this work, an All Digital Phase Locked Loop with an improved input clock failure detector is presented. The All Digital Phase Locked Loop proposed in this paper is designed to operate from 61KHz to 42Mhz. A completely digital approach is used for the design. The design achieves lock in less than 5 reference cycles. The input clock fail detector circuit detects the loss of input signal and notifies the controller. Fault detection is possible at an early stage and hence, it takes only 2 Digitally Controlled Oscillator clock cycles for stuck at fault detection and 1 reference clock cycle for out of limit fault detection. Entire design is done in Verilog hardware description language and hence it is highly versatile. Synthesis is done using cadence RTL compiler.
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