{"title":"快速大电流晶闸管非破坏性单事件烧断试验的尝试","authors":"V. Senaj, L. Ducimetière","doi":"10.1109/PPC.2011.6191515","DOIUrl":null,"url":null,"abstract":"This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.","PeriodicalId":331835,"journal":{"name":"2011 IEEE Pulsed Power Conference","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Attempt to a non-destructive Single Event Burnout test of Fast High Current Thyristors\",\"authors\":\"V. Senaj, L. Ducimetière\",\"doi\":\"10.1109/PPC.2011.6191515\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.\",\"PeriodicalId\":331835,\"journal\":{\"name\":\"2011 IEEE Pulsed Power Conference\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE Pulsed Power Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PPC.2011.6191515\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE Pulsed Power Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PPC.2011.6191515","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Attempt to a non-destructive Single Event Burnout test of Fast High Current Thyristors
This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.