{"title":"智能应用软件测试与评估技术分析","authors":"Yingbei Niu, Zhenyu Wu, Feng Liang","doi":"10.1145/3448734.3450906","DOIUrl":null,"url":null,"abstract":"Aiming at the problem of intelligent application software evaluation, this paper analyzes several common defect location technologies: defect location technology based on coverage, defect location technology based on program slice, defect location technology based on model and algorithm evaluation method. Aiming at the deep learning algorithm model based on convolutional neural network commonly used in intelligent application software, the corresponding test method is proposed. This paper compares the advantages of intelligent application software testing with traditional software testing, and discusses the challenges and development direction of intelligent application software testing in the future.","PeriodicalId":105999,"journal":{"name":"The 2nd International Conference on Computing and Data Science","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Intelligent application software testing and evaluation technology\",\"authors\":\"Yingbei Niu, Zhenyu Wu, Feng Liang\",\"doi\":\"10.1145/3448734.3450906\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Aiming at the problem of intelligent application software evaluation, this paper analyzes several common defect location technologies: defect location technology based on coverage, defect location technology based on program slice, defect location technology based on model and algorithm evaluation method. Aiming at the deep learning algorithm model based on convolutional neural network commonly used in intelligent application software, the corresponding test method is proposed. This paper compares the advantages of intelligent application software testing with traditional software testing, and discusses the challenges and development direction of intelligent application software testing in the future.\",\"PeriodicalId\":105999,\"journal\":{\"name\":\"The 2nd International Conference on Computing and Data Science\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The 2nd International Conference on Computing and Data Science\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3448734.3450906\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 2nd International Conference on Computing and Data Science","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3448734.3450906","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of Intelligent application software testing and evaluation technology
Aiming at the problem of intelligent application software evaluation, this paper analyzes several common defect location technologies: defect location technology based on coverage, defect location technology based on program slice, defect location technology based on model and algorithm evaluation method. Aiming at the deep learning algorithm model based on convolutional neural network commonly used in intelligent application software, the corresponding test method is proposed. This paper compares the advantages of intelligent application software testing with traditional software testing, and discusses the challenges and development direction of intelligent application software testing in the future.