Ying-Chih Wang, Anvesh Komuravelli, P. Zuliani, E. Clarke
{"title":"模拟电路通过统计模型检查验证","authors":"Ying-Chih Wang, Anvesh Komuravelli, P. Zuliani, E. Clarke","doi":"10.1109/ASPDAC.2011.5722168","DOIUrl":null,"url":null,"abstract":"We show how statistical Model Checking can be used for verifying properties of analog circuits. As integrated circuit technologies scale down, manufacturing variations in devices make analog designs behave like stochastic systems. The problem of verifying stochastic systems is often difficult because of their large state space. Statistical Model Checking can be an efficient verification technique for stochastic systems. In this paper, we use sequential statistical techniques and model checking to verify properties of analog circuits in both the temporal and the frequency domain. In particular, randomly sampled system traces are sequentially generated by SPICE and passed to a trace checker to determine whether they satisfy a given specification, until the desired statistical strength is achieved.","PeriodicalId":316253,"journal":{"name":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-01-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Analog circuit verification by statistical model checking\",\"authors\":\"Ying-Chih Wang, Anvesh Komuravelli, P. Zuliani, E. Clarke\",\"doi\":\"10.1109/ASPDAC.2011.5722168\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We show how statistical Model Checking can be used for verifying properties of analog circuits. As integrated circuit technologies scale down, manufacturing variations in devices make analog designs behave like stochastic systems. The problem of verifying stochastic systems is often difficult because of their large state space. Statistical Model Checking can be an efficient verification technique for stochastic systems. In this paper, we use sequential statistical techniques and model checking to verify properties of analog circuits in both the temporal and the frequency domain. In particular, randomly sampled system traces are sequentially generated by SPICE and passed to a trace checker to determine whether they satisfy a given specification, until the desired statistical strength is achieved.\",\"PeriodicalId\":316253,\"journal\":{\"name\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-01-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASPDAC.2011.5722168\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASPDAC.2011.5722168","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analog circuit verification by statistical model checking
We show how statistical Model Checking can be used for verifying properties of analog circuits. As integrated circuit technologies scale down, manufacturing variations in devices make analog designs behave like stochastic systems. The problem of verifying stochastic systems is often difficult because of their large state space. Statistical Model Checking can be an efficient verification technique for stochastic systems. In this paper, we use sequential statistical techniques and model checking to verify properties of analog circuits in both the temporal and the frequency domain. In particular, randomly sampled system traces are sequentially generated by SPICE and passed to a trace checker to determine whether they satisfy a given specification, until the desired statistical strength is achieved.