F. J. Rubio-Barbero, Eros Camacho-Ruiz, R. Castro-López, E. Roca, F. Fernández
{"title":"一个峰值检测和保持电路,用于测量和利用65nm CMOS PUF中的RTN","authors":"F. J. Rubio-Barbero, Eros Camacho-Ruiz, R. Castro-López, E. Roca, F. Fernández","doi":"10.1109/SMACD58065.2023.10192247","DOIUrl":null,"url":null,"abstract":"A Physical Unclonable Function (PUF) that uses the Random Telegraph Noise (RTN) effect has been recently proposed. This PUF requires an analog sensing component whose design becomes critical to properly process the underlying entropy and thus provide a response to a given challenge. This analog sensing component needs to keep track of the RTN fluctuations through the detection and acquisition of the maximum and minimum excursions of a signal of interest that contains all the RTN information in a transistor. This paper describes the Peak Detect and Hold circuit that carries out that tracking, which has been designed with accuracy, reliability and fast dynamic response in mind. The proposed implementation has been designed in a 65-nm CMOS technology with a supply voltage of 1.2 V.","PeriodicalId":239306,"journal":{"name":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF\",\"authors\":\"F. J. Rubio-Barbero, Eros Camacho-Ruiz, R. Castro-López, E. Roca, F. Fernández\",\"doi\":\"10.1109/SMACD58065.2023.10192247\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A Physical Unclonable Function (PUF) that uses the Random Telegraph Noise (RTN) effect has been recently proposed. This PUF requires an analog sensing component whose design becomes critical to properly process the underlying entropy and thus provide a response to a given challenge. This analog sensing component needs to keep track of the RTN fluctuations through the detection and acquisition of the maximum and minimum excursions of a signal of interest that contains all the RTN information in a transistor. This paper describes the Peak Detect and Hold circuit that carries out that tracking, which has been designed with accuracy, reliability and fast dynamic response in mind. The proposed implementation has been designed in a 65-nm CMOS technology with a supply voltage of 1.2 V.\",\"PeriodicalId\":239306,\"journal\":{\"name\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SMACD58065.2023.10192247\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMACD58065.2023.10192247","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Peak Detect & Hold circuit to measure and exploit RTN in a 65-nm CMOS PUF
A Physical Unclonable Function (PUF) that uses the Random Telegraph Noise (RTN) effect has been recently proposed. This PUF requires an analog sensing component whose design becomes critical to properly process the underlying entropy and thus provide a response to a given challenge. This analog sensing component needs to keep track of the RTN fluctuations through the detection and acquisition of the maximum and minimum excursions of a signal of interest that contains all the RTN information in a transistor. This paper describes the Peak Detect and Hold circuit that carries out that tracking, which has been designed with accuracy, reliability and fast dynamic response in mind. The proposed implementation has been designed in a 65-nm CMOS technology with a supply voltage of 1.2 V.