{"title":"非均匀场介质系统的电场模拟","authors":"V. J. Gandhi, S. Mahajan","doi":"10.1109/SSST.1990.138129","DOIUrl":null,"url":null,"abstract":"The charge simulation method (CSM) is used to compute potential and electric field distribution in a 'hyperboloid-plane' electrode system. Electric field enhancement along the axis of the hyperboloid and within the dielectric is calculated at various interelectrode spacings and with various tip radii. Results are consistent with geometrical configurations and within +or-1% accuracy.<<ETX>>","PeriodicalId":201543,"journal":{"name":"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electric field simulation in a non-uniform field dielectric system\",\"authors\":\"V. J. Gandhi, S. Mahajan\",\"doi\":\"10.1109/SSST.1990.138129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The charge simulation method (CSM) is used to compute potential and electric field distribution in a 'hyperboloid-plane' electrode system. Electric field enhancement along the axis of the hyperboloid and within the dielectric is calculated at various interelectrode spacings and with various tip radii. Results are consistent with geometrical configurations and within +or-1% accuracy.<<ETX>>\",\"PeriodicalId\":201543,\"journal\":{\"name\":\"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-03-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SSST.1990.138129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1990] Proceedings. The Twenty-Second Southeastern Symposium on System Theory","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SSST.1990.138129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electric field simulation in a non-uniform field dielectric system
The charge simulation method (CSM) is used to compute potential and electric field distribution in a 'hyperboloid-plane' electrode system. Electric field enhancement along the axis of the hyperboloid and within the dielectric is calculated at various interelectrode spacings and with various tip radii. Results are consistent with geometrical configurations and within +or-1% accuracy.<>