在10Gbps设备的自动化测试设备上实现测试时间优化伪随机比特流(PRBS) 2/sup 31/ BER测试

Shao Chee Ong
{"title":"在10Gbps设备的自动化测试设备上实现测试时间优化伪随机比特流(PRBS) 2/sup 31/ BER测试","authors":"Shao Chee Ong","doi":"10.1109/DELTA.2006.44","DOIUrl":null,"url":null,"abstract":"Pseudorandom bit stream (PRBS) testing is critical in network and communication devices to ensure compliant to industry standards. Thus, many new high speed devices have been designed with internal PRBS generator and comparator capability for built-in-self-test. On the other hand, devices that are without this design-for-test feature will have to be tested through conventional methods such as bit error rate (BER) tester due to capability limitation on automated test equipment (ATE). However, this setup is typically expensive and unfriendly in a high volume manufacturing due to long test time, rack and stack setup and dedicated systems. A novel idea was conceived where a pair of programmable PRBS drivers and comparators is embedded into the test loadboard to provide the BER test capability. Coupled with an intelligent BER algorithm, the solution provides a low cost BER test solution that can be implemented in a high volume manufacturing using only a mixed signal ATE.","PeriodicalId":439448,"journal":{"name":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Enabling test-time optimized pseudorandom bit stream (PRBS) 2/sup 31/ BER testing on automated test equipment for 10Gbps device\",\"authors\":\"Shao Chee Ong\",\"doi\":\"10.1109/DELTA.2006.44\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Pseudorandom bit stream (PRBS) testing is critical in network and communication devices to ensure compliant to industry standards. Thus, many new high speed devices have been designed with internal PRBS generator and comparator capability for built-in-self-test. On the other hand, devices that are without this design-for-test feature will have to be tested through conventional methods such as bit error rate (BER) tester due to capability limitation on automated test equipment (ATE). However, this setup is typically expensive and unfriendly in a high volume manufacturing due to long test time, rack and stack setup and dedicated systems. A novel idea was conceived where a pair of programmable PRBS drivers and comparators is embedded into the test loadboard to provide the BER test capability. Coupled with an intelligent BER algorithm, the solution provides a low cost BER test solution that can be implemented in a high volume manufacturing using only a mixed signal ATE.\",\"PeriodicalId\":439448,\"journal\":{\"name\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"volume\":\"3 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-01-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DELTA.2006.44\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Third IEEE International Workshop on Electronic Design, Test and Applications (DELTA'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DELTA.2006.44","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

伪随机比特流(PRBS)测试是确保网络和通信设备符合行业标准的关键。因此,许多新的高速器件被设计为具有内置自检的内部PRBS发生器和比较器功能。另一方面,由于自动化测试设备(ATE)的能力限制,没有这种专为测试而设计的设备将不得不通过传统方法进行测试,例如误码率(BER)测试仪。然而,由于测试时间长、机架和堆栈设置以及专用系统,这种设置在大批量制造中通常是昂贵且不友好的。一个新颖的想法是将一对可编程的PRBS驱动程序和比较器嵌入到测试负载板中,以提供误码率测试能力。结合智能误码率算法,该解决方案提供了一种低成本的误码率测试解决方案,可以在仅使用混合信号ATE的大批量生产中实现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enabling test-time optimized pseudorandom bit stream (PRBS) 2/sup 31/ BER testing on automated test equipment for 10Gbps device
Pseudorandom bit stream (PRBS) testing is critical in network and communication devices to ensure compliant to industry standards. Thus, many new high speed devices have been designed with internal PRBS generator and comparator capability for built-in-self-test. On the other hand, devices that are without this design-for-test feature will have to be tested through conventional methods such as bit error rate (BER) tester due to capability limitation on automated test equipment (ATE). However, this setup is typically expensive and unfriendly in a high volume manufacturing due to long test time, rack and stack setup and dedicated systems. A novel idea was conceived where a pair of programmable PRBS drivers and comparators is embedded into the test loadboard to provide the BER test capability. Coupled with an intelligent BER algorithm, the solution provides a low cost BER test solution that can be implemented in a high volume manufacturing using only a mixed signal ATE.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信