光学连续切片显微镜的缺锥问题和低通畸变

F. Macías-Garza, A. Bovik, K. Diller, S. Aggarwal, J. Aggarwal
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引用次数: 20

摘要

在光学连续切片中,通过增加光学显微镜通过标本的聚焦平面来观察显微标本的三维结构。如果显微镜的景深是无穷小的,从每个聚焦平面得到的图像是样品光密度的一个聚焦切片。作者表明,任何实用显微镜的有限孔径都不可避免地导致光密度的三维傅立叶谱中沿光轴方向的频率双次域的损失。因此,沿此轴的分辨率严重降低。在缺失的频率锥体之外,频谱被强烈的低通效应扭曲。利用几何光学原理,并假设试样的吸收是线性和无衍射的,得到了整体畸变函数的封闭形式表达式。讨论了利用光学连续切片恢复三维图像的方法,并给出了几个实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The missing cone problem and low-pass distortion in optical serial sectioning microscopy
In optical serial sectioning, the 3-D structure of a microscopic specimen is observed by incrementing the focusing plane of a light microscope through the specimen. If the depth of field of the microscope is infinitesimal, the image obtained from each focusing plane is an in-focus slice of the optical density of the specimen. The authors show that the finite aperture of any practical microscope inevitably results in the loss of a biconic region of frequencies in the 3-D Fourier spectrum of the optical density, oriented in the direction of the optical axis. Thus, the resolution along this axis is severely reduced. Outside the missing cone of frequencies, the spectrum is distorted by a strong low-pass effect. A closed form expression is obtained for the overall distortion function using principles of geometric optics, and by assuming that the absorption of the specimen is linear and nondiffractive. Methods for restoring the 3-D images obtained through optical serial sectioning are considered, and several examples are provided.<>
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