用于at切割晶圆的石英高速化学蚀刻量产

T. Watanabe
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引用次数: 6

摘要

发现了以低于晶体生长速度的速度进行刻蚀时,蚀刻坑和蚀刻通道不能产生at切割石英晶片所需的刻蚀速率的现象。测试的高速化学蚀刻过程,包括研磨到抛光晶圆,在不到4分钟内完成。作为形成镜面的条件,在蚀刻前去除晶片污染的超净清洗方法是一个重要的因素。介绍了用高速化学蚀刻法对2000号光洁度晶片进行批量加工的制造工艺,使批量生产成为可能。高速化学蚀刻。该方法也适用于在较高工作频率下生产2 /spl μ m厚度的薄晶片。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Mass production of quartz high-speed chemical etching applied to AT-cut wafers
The phenomenon in which etch pits and etch channels did not generate the required etching rate of an AT-cut quartz crystal wafer by carrying out etching at a rate lower than the growth speed of crystal was discovered. The high-speed chemical etching process examined, including lapping to polishing of the crystal wafers, was performed in less than 4 minutes. As a condition for which a mirror surface is possible, the ultra-clean washing method of removing contamination of the crystal wafer before etching was shown to be an important element. The manufacturing process for carrying out batch processing of the crystal wafer of #2000 finish after cutting by this high-speed chemical etching was shown, and mass production was made possible. The high-speed chemical etching. method is applied also to 2 /spl mu/m thickness thin crystal wafer production used at higher operating frequencies.
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