深度学习隐写分析中的覆盖源不匹配问题

Quentin Giboulot, Patrick Bas, R. Cogranne, Dirk Borghys
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引用次数: 2

摘要

本文研究了隐写分析中的覆盖源不匹配问题,即测试集与训练集的来源不同所产生的影响。在本研究中,经过训练的隐写分析器使用最先进的深度学习架构,比基于特征的隐写分析更容易泛化。不同的来源,如传感器的型号,ISO灵敏度,处理流程和内容,进行了研究。我们的结论是,一方面,深度学习隐写分析对CSM仍然非常敏感,另一方面,整体策略利用深度学习良好的泛化特性,在训练样本数量相对较少的情况下减少CSM。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Cover Source Mismatch Problem in Deep-Learning Steganalysis
This paper studies the problem of Cover Source Mismatch (CSM) in steganalysis, i.e. the impact of a testing set which does not originate from the same source than the training set. In this study, the trained steganalyzer uses state of the art deep-learning architecture prone to better generalization than feature-based steganalysis. Different sources such as the sensor model, the ISO sensitivity, the processing pipeline and the content, are investigated. Our conclusions are that, on one hand, deep learning steganalysis is still very sensitive to the CSM, on the other hand, the holistic strategy leverages the good generalization properties of deep learning to reduce the CSM with a relatively small number of training samples.
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