亚阈值泄漏电流:挑战和解决方案

M. Anis
{"title":"亚阈值泄漏电流:挑战和解决方案","authors":"M. Anis","doi":"10.1109/ICM.2003.238359","DOIUrl":null,"url":null,"abstract":"As technology scales deeper into the nanometer regime, leakage Power is one of the main obstacles to Moore's law. This paper provides an overview of leakage current highlighting its major mechanisms. Subthreshold leakage current becomes the major focus of this paper, outlining how it is impacted by technology scaling. The major techniques used to manage leakage current in industry are then addressed.","PeriodicalId":180690,"journal":{"name":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Subthreshold leakage current: challenges and solutions\",\"authors\":\"M. Anis\",\"doi\":\"10.1109/ICM.2003.238359\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As technology scales deeper into the nanometer regime, leakage Power is one of the main obstacles to Moore's law. This paper provides an overview of leakage current highlighting its major mechanisms. Subthreshold leakage current becomes the major focus of this paper, outlining how it is impacted by technology scaling. The major techniques used to manage leakage current in industry are then addressed.\",\"PeriodicalId\":180690,\"journal\":{\"name\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"volume\":\"63 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2003.238359\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2003.238359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

摘要

随着技术深入到纳米级,泄漏功率成为摩尔定律的主要障碍之一。本文概述了泄漏电流的主要机理。亚阈值泄漏电流成为本文的主要焦点,概述了技术缩放对其的影响。然后讨论了工业中用于管理泄漏电流的主要技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Subthreshold leakage current: challenges and solutions
As technology scales deeper into the nanometer regime, leakage Power is one of the main obstacles to Moore's law. This paper provides an overview of leakage current highlighting its major mechanisms. Subthreshold leakage current becomes the major focus of this paper, outlining how it is impacted by technology scaling. The major techniques used to manage leakage current in industry are then addressed.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信