拉伸应力和热应力老化下EPR电缆的频域光谱分析

Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong
{"title":"拉伸应力和热应力老化下EPR电缆的频域光谱分析","authors":"Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong","doi":"10.1109/ICHVE53725.2022.9961564","DOIUrl":null,"url":null,"abstract":"Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.","PeriodicalId":125983,"journal":{"name":"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Frequency Domain Spectroscopy Analysis of EPR Cable under the Aging of Tensile Stress and Thermal Stress\",\"authors\":\"Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong\",\"doi\":\"10.1109/ICHVE53725.2022.9961564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.\",\"PeriodicalId\":125983,\"journal\":{\"name\":\"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICHVE53725.2022.9961564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHVE53725.2022.9961564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

由于矿井中多种应力的共同作用导致EPR电缆寿命降低,因此有必要对EPR电缆的老化机理进行研究。本文搭建了一个介电谱测试平台,测量了EPR在老化温度、拉伸应力以及不同测试温度、老化时间影响下的介电谱变化。并对EPR的介电谱拉伸比进行了分析。测试结果表明,复介电常数实部和介电损耗因子随测试温度的升高呈指数增长。随着老化时间的增加,复介电常数实部增大。介质损耗因子先减小后增大。随着拉伸比的增大,复介电常数实部和虚部均先减小后增大。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Frequency Domain Spectroscopy Analysis of EPR Cable under the Aging of Tensile Stress and Thermal Stress
Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.
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