Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong
{"title":"拉伸应力和热应力老化下EPR电缆的频域光谱分析","authors":"Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong","doi":"10.1109/ICHVE53725.2022.9961564","DOIUrl":null,"url":null,"abstract":"Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.","PeriodicalId":125983,"journal":{"name":"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Frequency Domain Spectroscopy Analysis of EPR Cable under the Aging of Tensile Stress and Thermal Stress\",\"authors\":\"Wei Li, Z. Lei, Qin He, Rui Cheng, Yuanyuan Li, Wang Wei, Y. Dong\",\"doi\":\"10.1109/ICHVE53725.2022.9961564\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.\",\"PeriodicalId\":125983,\"journal\":{\"name\":\"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-09-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICHVE53725.2022.9961564\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHVE53725.2022.9961564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Frequency Domain Spectroscopy Analysis of EPR Cable under the Aging of Tensile Stress and Thermal Stress
Because of the situation that the life of Ethylene propylene rubber(EPR) cable is reduced due to the joint action of multiple stresses in the mine, it is necessary to study the aging mechanism of EPR cable. In this paper, a dielectric spectrum testing platform was built to measure the changes of dielectric spectrum of EPR under aging temperature, tensile stress, and different test temperatures, the effects of aging time. and tensile ratio on the dielectric spectrum of EPR were analyzed. The test results show that the real part of the complex dielectric constant and the dielectric loss factor increases exponentially with the increases of the test temperature. With aging time increasing, the real part of the complex dielectric constant increase. and the dielectric loss factor decrease first and then increase. With the increase in tensile ratio, both the real and imaginary parts of the complex dielectric constant decrease first and then increase.