复杂和任意的双边鳍线的完整分析

ITS'98 Proceedings. SBT/IEEE International Telecommunications Symposium (Cat. No.98EX202) Pub Date : 1998-08-09 DOI:10.1109/ITS.1998.718428

Humberto Fernandes, J. De Albuquerque Sales Neto

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引用次数: 0

摘要

首次建立了一种电磁应用程序，可同时获得具有半导体衬底和导体厚度的任意双翅片线的有效介电常数、衰减常数和特性阻抗。在分析中还采用了简洁的横向传输线(TTL)全波法。得到了复合传播和特征阻抗随频率、衬底尺寸和电导率变化的新结果。

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Complete analysis of the complex and arbitrary bilateral finlines

An electromagnetic application is developed to obtain the effective dielectric constant, the attenuation constant and the characteristic impedance of the arbitrary bilateral fin lines with semiconductor substrate and conductor thickness simultaneity for the first time. Also the concise transverse transmission line (TTL) full wave method is used in the analysis. New results of the complex propagation and of the characteristic impedance as functions of the frequency and different dimensions and conductivity of the substrate, are obtained in 3D.

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ITS'98 Proceedings. SBT/IEEE International Telecommunications Symposium (Cat. No.98EX202)

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